Synchrotron X-Ray Diffraction Topography of Semiconductor Heterostructures
نویسندگان
چکیده
7 VP T J üú û üŗ 4 J W VN»»S » û þĀŗ VS O ". . *Ć Ğ Ğ /,(Ą ðĞ Ć Ć ăāĂĚ ăÿüĚ Āú Ě þăüû Ě üŗ Preface " Jokainen tsäänssi on mahdollisuus! " – Matti Nykänen (Every chance is an opportunity) The work presented in this thesis was carried out in Optoelectronics Laboratory , of Electrical Engineering between 2003 and 2012. I want to express my sincere gratitude to Professor Harri Lipsanen for supervising this thesis, and for the opportunity to work on such interesting field as material science is. I am deeply grateful and indebted to the advisor of this thesis, Prof. Turkka O. Tuomi for his invaluable suggestions and insightful advice concerning synchrotron sciences and this thesis. I would also like to thank Professor Tuomi for the numerous in-sightful discussions we have had, and for the continued support during the rather long while this thesis was slowly progressing. I thank Dr. Markku Sopanen for the valuable advice and amicable help concerning this thesis. I will gladly take the opportunity here to thank Dr. Varis for the swift cooperation in the laboratory and on the field, and for being good people. Hey, let's go and have a beer together some of these days! the University of Hamburg for precious bits of information and science, as well as for the many insightful debates we have had. I want to express my gratitude to my parents Heikki and Terttu, and to my dear sister Vilja for their love and support. Finally, I thank my dear partner Dr. Annika for all the love and understanding!
منابع مشابه
Detection of breast cancer using non-invasive X-ray diffraction technique of hair: A preliminary study
Background: An early diagnosis of breast cancer relates directly to an accurate treatment plan and strategy. Early detection of breast cancer before its development would be a significant reduction of morbidity and mortality rates. The aim of this preliminary study is to investigate the sensitivity of Wide Angle X-ray diffraction (WAXRD) method on women hair samples of healthy and breast cancer...
متن کاملMechanics of Microelectronics Structures as Revealed by X-ray Diffraction
The presence of strain distributions within semiconductor features influences many aspects of their behavior. For example, microelectronic technology that incorporates strained silicon improves device performance by increasing carrier mobility in the Si channels. Because current semiconductor fabrication contains multiple levels of metallic and dielectric structures, an understanding of the mec...
متن کاملX-ray and Raman scattering characterization of GelSi buried layers
The synthesis of semiconductor layered structures with abrupt interfaces is a major goal in the development of new materials with useful electrical and optical properties. Structures such as short-period superlattices, resonant tunneling diodes, and delta-doped layers can be improved by elimination of random potential fluctuations that tend to destroy coherent etfects such as tunneling, direct ...
متن کاملA Review of the Applications of Synchrotron Radiation in Archaeological Sciences
The scientific research regarding investigation, characterization and protection of the archeological specimens is manifested through a notable participation of multidisciplinary subjects and experts, scientists and archeometrists. One of the main principals which are considered by archaeometrists in the study of the precious specimens is the utilizing nondestructive methods. As an example, in ...
متن کاملAnalysis of x - ray diffraction as a probe of interdiffusion in Si / SiGe heterostructures
Analysis of x-ray diffraction as a probe of interdiffusion in Si/SiGe heterostructures D.B. Aubertine, N. Ozguven, and P.C. McIntyre Department of Materials Science and Engineering Stanford University, Stanford, CA S. Brennan Stanford Synchrotron Radiation Laboratory Stanford Linear Accelerator Center, Stanford, CA We investigate numerical simulations that utilize a non-linear interdiffusion so...
متن کامل